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WEBINAR - Metrology Extension for 3D X-ray Microscopes
By adding Measurement Accuracy to X-ray Microscopy the MTX option extends ZEISS world-class metrology offerings to the well-known, high-resolution imaging capabilities of ZEISS 3D X-ray microscopes.
Learn more in this webinar 17th September 2020!
Highlights of webinar:
- Combine high-resolution X-ray imaging with high-precision metrology capabilities.
- Measure with an accuracy far beyond the limits of conventional X-ray CT metrology.
- Use seamless accuracy verification in accordance with the VDI/VDE 2630-1.3 part 1.
- Non-destructively inspect the design of a part’s complex internal and external features.
- Reveal the smallest dimensions and measure them most accurately.
